Patrick G. O'Shea
Department of Electrical and Computer Engineering; University of Maryland
The performance of free-electron lasers depends critically on the
quality of the electron beams used as drivers. In recent years, the
growing requirements of short-pulse, high-gain FELs with sub-ps electron
pulses have resulted in the developments of novel techniques for
longitudinal pulse characterization. Such diagnostics range from simple
FIR detectors to sophisticated optoelectronic devices. The ideal
diagnostic should give us more information than just a single figure of
merit